Complex Functional Control Test Bench for Electronic Blocks and Components Model FT-17 (Sovtest ATE)

FT-17 is a flexible multi-purpose automated test system for functional and parametric control of digital and analog electronic units. The functioning of FT-17 is based on the method of controlling impact generation on the tested unit with further handling of the results. FT-17 can also be used for fault location on the component level with the help of analogue-signature analysis.


Application:
- testing and adjustment of electronic units during production
- troubleshooting and repair
- integration to environmental test benches (temperature, climatic, etc.)
- portable test systems
- input/Output component control
- database
- production management
- scientific researches.

In addition to general-purpose hardware FT-17 test bench can be fitted with specialized blocks for aircraft, automotive, telecommunications industries or with specially-designed blocks for particular Customer’s needs. For military or transport industry, FT-17 can be provided as portable shielded unit for field conditions or for including as airborne equipment.
FT-17 is certified with the Certificate of confirmation of Military measuring apparatus type.



Description:
FT-17 is designed on the basis of GX7xxx instrumental racks (Geotest Inc, USA) with 3 to 20 slots for standard PXI and PXI Express test blocks.
PXI is the most widespread and the most prospective for today industrial standard, maintained by the great number of apparatus manufacturers.
Supporting different PXI block from any manufacturer allows to fit GX7xxx with a wide range of apparatus, e.g. analog meters and generators, input-output digital blocks, multiplexers, programmable and fixed power supply units, interface blocks, image-processing systems, etc.


ATEasy Software:
Windows-based ATEasy software allows on-the-fly test program creation, operator interface creation, accumulation of statistical test results data, new test blocks integration to the system. Using this licensed software and on the basis of performance specification approved by the Customer, we create scalable high-capacity functional test systems allowing the following:
- supply voltage with automatic adjustment (min to max in the tolerance range for the tested unit);
- digital and analog signals in wide frequency and voltage range;
- parameter changing for output signals;
- loads emulation;
- noise emulation;
- data exchange with tested unit;
- measured results handling and display on the PC monitor or printing in user-friendly form;
- automatic saving of adjustment or inspection protocol with reference to unit serial number, operator, execution time, etc;
- accumulation and processing of statistical information;
- printing test or adjustment results.


Fixtures:
During the functional test the access to the tested unit is realized through edge connector. For this purpose we use test fixture designed for particular Customer’s device.
Spring loaded test probes are used for contacting. Such method provides up to 3 million contact cycles.

Structure of tester (configuration example):
Instrument Rack and Interface:
- cabinet 19”
- GX7xxx Rack for test blocks for 20 slots, including receiver for test fixture,
system power supply units, cooling system.
Installation into cabinet 19”
- Test fixture for Customer’s unit
- PC-based test controller, installation into cabinet 19”
- GX7990 Interface between racks and test controller consisting of two boards and connection cable. One board is installed in test controller,another one – into GX7xxx rack

PXI modules:
- GX7400 - frame for power supply modules
- GT7430 - programmable power supply module 0-30V, 0-5A
- GX1838 - digital-to-analog converter with 8 channels for test signal render to the tested unit
- cPCI9112 – Analog-to-digital converter with 16 channels for output signal electrical parameters changing
- SMX2044 – digital multimeter for measurement of resistance, capacity, inductivity, frequency
- GPIB II – GPIB controller for peripheral devices (oscillograph, power supply, programmable load, etc.)
- GX6146C – Scanner-multiplexer 4 groups of 2х16 channels for input and output signal commutation
- TDS-2000 – Two-channel digital storage oscillograph TDS2000 series with GPIB interface
- ATEasy 6.0 – Software environment for test program creation and execution

Technical specifications

SUPPLY VOLTAGE (TO TESTED UNIT)
Channels with programmable voltage, power up to 150 W
Voltage value	Programmable in range of 0 to 60 V
Accuracy of output set voltage	20 mV
Output voltage pulse level	30 mV max (range)
Output current value	From 0-5 A at output voltage range 0 to 30 V, 0-2.5 A at output voltage range 30 Â to60 Â
Power sources	150 W max
Number of channels	4 galvanically isolated channels
Protection	- overvoltage - overload - overheat
Channels with programmable voltage, power up to 2 kW
Voltage value	Programmable in range of 0 to 2000 V
Output current value	0 to 125 A
Power sources	2 kW max (possibility to increase output voltage)
Number of channels	4 galvanically isolated channels (possibility of number of channels extension)
Control	GPIB, RS232, RS485 Interfaces
Protection	- overvoltage - overload - overheat
DIGITAL SYSTEMS
Dynamic digital signals
Maximum test frequency	Up to 200 MHz
Signal levels	programmable level"1": 0-12 V, programmable threshold: 0-8 Â (possibility to adjust levels according to the tested unit)
Number of channels	Up to 256 two-direction channels with the possibility of extension up to 1024
Buffer volume	Up to 4Gbit per channel (depends on the number of used channels)
Static digital signals
Levels of signal	TTL, CMOS, LVDS, open collector programmable level "1": -12 V to +12 V, programmable threshold: 0-8 Â (possibility to adjust levels according to the tested unit)
Number of channels	Up to 512 two-direction channels with the possibility of extension up to 1024
SET ANALOGUE SIGNALS
Signal generation with the integrated generator
Signal shape	Sine, saw, meander, signals of random shape, "white noise"
Signal frequency	Up to 2 GHz
Signal measurement with integrated Digital-to-analog converter
Number of channels	64 galvanically isolated channels with possibility of extension
Output voltage value	Programmable in range of -20 V to +32 V
ANALOGUE SIGNALS MEASUREMENT
Signal measurement with integrated Analog-to-digital converter
Number of channels	64 differential channels with possibility of extension
Measurement range	Output voltage range 50mV/div - 5V/div Measured signal frequency 2 GHz Input resistance 1Megohm/15pF
Signal measurement with the help of integrated multimeter
Voltage measurement range	0 to 330 V with programmable measuring limits
Current measurement range	0 to 2.5 A with programmable measuring limits
Resistance measurement range	0 to330 MOhms with programmable measuring limits
Frequency measurement range	0 to 300 kHz with programmable measuring limits
FAULT LOCATOR FOR COMPONENT LEVEL
Test ranges	1V - 500uA 10V - 5mA 10V - 150mA 20V - 1mA 40V - 1mA
Test frequencies	50Hz 100 Hz 500 Hz 1000 Hz 2000 Hz
Pulse generator	DC Pulse modes 1, 2 Pulse width adjustment Level 0 - 7Â
CONTROL COMPUTER
	Intel P4-based PLC ROBO-2000 mounted in 19"cabinet, monitor, keyboard, mouse, GPIB interface for peripheral units connection
CONNECTION TO TESTED UNIT
	Universal test receiver
GENERAL CHARACTERISTICS
Dimensions	600õ800õ1700 mm
Weight	110 kg
Power supply	~220V, 50 Hz
Ambient temperature	10 - 50 Ñ
Humidity	20 - 90%